- 专利标题: Curvature measurement apparatus
-
申请号: US16145793申请日: 2018-09-28
-
公开(公告)号: US10704886B2公开(公告)日: 2020-07-07
- 发明人: Chuan Yu Zhang , Yue Zhuo , Dong Li , Rui Gong Zhang
- 申请人: Siemens Aktiengesellschaft
- 申请人地址: DE Munich
- 专利权人: SIEMENS AKTIENGESELLSCHAFT
- 当前专利权人: SIEMENS AKTIENGESELLSCHAFT
- 当前专利权人地址: DE Munich
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@522da6a8
- 主分类号: G01B7/287
- IPC分类号: G01B7/287 ; G06F3/01 ; G01B21/32 ; G01B7/16
摘要:
An embodiment relates to a curvature measurement apparatus. The apparatus includes a first curvature measurement unit configured to, upon a curvature of an object to be measured being relatively greater than a first curvature, measure the curvature of the object to be measured; and a second curvature measurement unit configured to, upon the curvature of the object to be measured being relatively smaller than a second curvature, measure the curvature of the object to be measured, the second curvature being relatively greater than or equal to the first curvature. The curvature measurement apparatus can improve an accuracy of a curvature of an object to be measured.
公开/授权文献
- US20190128658A1 CURVATURE MEASUREMENT APPARATUS 公开/授权日:2019-05-02
信息查询