Invention Grant
- Patent Title: Method and device for measuring antenna reflection coefficient
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Application No.: US16561579Application Date: 2019-09-05
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Publication No.: US10727958B2Publication Date: 2020-07-28
- Inventor: Daeyoung Kim , Youngik Cho
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7984e5cc com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6fb331c6
- Main IPC: H04B7/04
- IPC: H04B7/04 ; H04B17/10 ; G01R29/10

Abstract:
A device for measuring a reflection coefficient of an antenna includes processing circuitry configured to extract a first feedback signal and a second feedback signal from a third feedback signal based on first symbol information of a first symbol included in a radio frequency (RF) transmit signal transferred to the antenna, the first feedback signal corresponding to at least a portion of a cyclic prefix portion of the first symbol, the second feedback signal corresponding to at least a portion of a back-end portion of the first symbol, the third feedback signal being generated from a portion of the RF transmit signal provided by a coupler, and compute the reflection coefficient based on the first feedback signal and the second feedback signal.
Public/Granted literature
- US20200169331A1 METHOD AND DEVICE FOR MEASURING ANTENNA REFLECTION COEFFICIENT Public/Granted day:2020-05-28
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