- 专利标题: Radiation phase contrast imaging device
-
申请号: US16335210申请日: 2017-07-28
-
公开(公告)号: US10729398B2公开(公告)日: 2020-08-04
- 发明人: Satoshi Sano , Koichi Tanabe , Toshinori Yoshimuta , Kenji Kimura , Hiroyuki Kishihara , Yukihisa Wada , Takuro Izumi , Taro Shirai , Takahiro Doki , Akira Horiba , Takayoshi Shimura , Heiji Watanabe , Takuji Hosoi
- 申请人: Shimadzu Corporation , OSAKA UNIVERSITY
- 申请人地址: JP Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto JP Yamadaoka, Suita-shi, Osaka
- 专利权人: Shimadzu Corporation,Osaka University
- 当前专利权人: Shimadzu Corporation,Osaka University
- 当前专利权人地址: JP Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto JP Yamadaoka, Suita-shi, Osaka
- 代理机构: Muir Patent Law, PLLC
- 国际申请: PCT/JP2017/027566 WO 20170728
- 国际公布: WO2018/061456 WO 20180405
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; A61B6/08
摘要:
An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit 3b, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.
信息查询