Invention Grant
- Patent Title: Apparatus and method for verifying repeatability of spectroscope, and apparatus for analyzing spectrum data
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Application No.: US15215050Application Date: 2016-07-20
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Publication No.: US10746597B2Publication Date: 2020-08-18
- Inventor: So Young Lee , Sang Kyu Kim , Kun Sun Eom , Joon Hyung Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5610f770
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G01J3/02 ; G01J3/28
Abstract:
An apparatus for verifying repeatability of a spectroscope may verify repeatability of spectrum data, measured by a spectroscope, based on repeatability verification criteria, and control the spectroscope whether or not to remeasure spectrum data.
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