Invention Grant
- Patent Title: X-ray CT measuring apparatus and interference prevention method thereof
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Application No.: US16250167Application Date: 2019-01-17
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Publication No.: US10753887B2Publication Date: 2020-08-25
- Inventor: Kozo Ariga , Gyokubu Cho , Hidemitsu Asano , Masato Kon
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@20b409cc
- Main IPC: G01N23/046
- IPC: G01N23/046

Abstract:
An X-ray CT measuring apparatus configured to emit an X-ray from an X-ray source while rotating a subject arranged on a rotary table, and obtain a tomographic image of the subject by reconstructing projection images, includes an imaging unit for imaging the subject on the rotary table from above or sideways, an obtaining unit for obtaining an image of the subject while rotating the subject, a calculating unit for calculating a maximum outer diameter of the subject during rotation by using the obtained image of the subject, and a setting unit for setting a movement limit of the rotary table on the basis of the maximum outer diameter.
Public/Granted literature
- US20190227004A1 X-RAY CT MEASURING APPARATUS AND INTERFERENCE PREVENTION METHOD THEREOF Public/Granted day:2019-07-25
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