- 专利标题: Method for determining bias in an inertial measurement unit of an image acquisition device
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申请号: US16154450申请日: 2018-10-08
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公开(公告)号: US10757333B2公开(公告)日: 2020-08-25
- 发明人: Piotr Stec
- 申请人: FotoNation Limited
- 申请人地址: IE Galway
- 专利权人: FotoNation Limited
- 当前专利权人: FotoNation Limited
- 当前专利权人地址: IE Galway
- 代理机构: Lee & Hayes, PC
- 主分类号: H04N5/232
- IPC分类号: H04N5/232 ; G01C25/00 ; G06T7/20
摘要:
A method for determining bias in an inertial measurement unit of an image acquisition device comprises mapping at least one reference point within an image frame into a 3D spherical space based on a lens projection model for the image acquisition device to provide a respective anchor point in 3D space for each reference point. For reference points within a given image frame, an estimate of frame-to-frame motion at the reference point between the given frame and a previously acquired frame is obtained; a measure of device orientation for an acquisition time of the reference point in the given frame and the previously acquired frame, the measure including a bias component, is obtained from the inertial measurement unit; a corresponding anchor point is projected in 3D space according to a difference in the measure of device orientation in the given frame and the previously acquired frame to provide a 3D vector Vm; a result of the estimated frame-to-frame motion for the point from the given frame is projected into the previously acquired frame into 3D space to provide a 3D vector Ve; and a cross product Vc of the 3D vectors Vm and Ve is used to update a bias component value.
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