- 专利标题: Surface measuring apparatus
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申请号: US15936851申请日: 2018-03-27
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公开(公告)号: US10760891B2公开(公告)日: 2020-09-01
- 发明人: Philipp Steuer
- 申请人: JENOPTIK Industrial Metrology Germany GmbH
- 申请人地址: DE Villingen-Schwenningen
- 专利权人: JENOPTIK Industrial Metrology Germany GmbH
- 当前专利权人: JENOPTIK Industrial Metrology Germany GmbH
- 当前专利权人地址: DE Villingen-Schwenningen
- 代理机构: Shlesinger, Arkwright & Garvey LLP
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@34be995b
- 主分类号: G01B5/20
- IPC分类号: G01B5/20 ; G01B5/008 ; G01B21/04 ; G01B5/28 ; G01B5/012
摘要:
Surface measuring apparatus for measuring a surface of a workpiece has a probe including a probe arm bearing a probe element for contacting workpiece surface to be measured. Surface measuring apparatus also has a feed apparatus for moving probe element relative to workpiece to be measured. Probe arm is detachably connectable or connected to a movable part of feed apparatus via a mechanical interface having a first part and a second part, which in installed position of probe arm are connected to one another with static determinacy on movable part of feed apparatus, and one of the parts is associated with probe arm and the other part is associated with feed apparatus. At least one alignment protrusion is on first part as an installation alignment aid, which in installed position of probe arm contactlessly or essentially contactlessly engages in an alignment recess formed on second part.
公开/授权文献
- US20190101371A1 SURFACE MEASURING APPARATUS 公开/授权日:2019-04-04
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