Invention Grant
- Patent Title: Method for forming a multi-level interconnect structure
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Application No.: US16518361Application Date: 2019-07-22
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Publication No.: US10763159B2Publication Date: 2020-09-01
- Inventor: Basoene Briggs , Christopher Wilson , Juergen Boemmels
- Applicant: IMEC VZW
- Applicant Address: BE Leuven
- Assignee: IMEC vzw
- Current Assignee: IMEC vzw
- Current Assignee Address: BE Leuven
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1afe0bff
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L21/768 ; H01L23/522

Abstract:
A method is provided for forming a multi-level interconnect structure on a semiconductor substrate, e.g., for use in an integrated circuit, comprising forming on the substrate a first interconnection level comprising a first dielectric layer and a first set of conductive structures arranged in the first dielectric layer, forming on the first interconnection level a second interconnection level comprising a second dielectric layer and a second set of conductive structures arranged in the second dielectric layer, and forming on the second interconnection level a third interconnection level.
Public/Granted literature
- US20200027780A1 METHOD FOR FORMING A MULTI-LEVEL INTERCONNECT STRUCTURE Public/Granted day:2020-01-23
Information query
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