Invention Grant
- Patent Title: Dithering and calibration technique in multi-stage ADC
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Application No.: US16545058Application Date: 2019-08-20
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Publication No.: US10763886B1Publication Date: 2020-09-01
- Inventor: Subramanian Jagdish Narayan , Chandana Krishna
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: H03M3/00
- IPC: H03M3/00 ; H03M1/68 ; H03M1/16 ; H03M1/44

Abstract:
A multi-stage analog-to-digital converter includes a signal input terminal, a first stage analog-to-digital converter, a digital-to-analog converter; a second stage analog-to-digital converter, and dither circuitry. The first stage analog-to-digital converter includes an input coupled to the signal input terminal. The digital-to-analog converter includes an input coupled to an output of the first stage analog-to-digital converter, and an input coupled to the signal input terminal. The second stage analog-to-digital converter includes a first input coupled to an output of the digital-to-analog converter. The dither circuitry is coupled to a second input of the second stage analog-to-digital converter, and is configured to provide a dither signal to the second stage analog-to-digital converter during selection of fewer than all bits of a digital value of a residue signal received from the digital-to-analog converter.
Information query