Invention Grant
- Patent Title: Detection of point sources with variable emission intensity in sequences of images with different point spread functions
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Application No.: US15751188Application Date: 2016-08-11
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Publication No.: US10776653B2Publication Date: 2020-09-15
- Inventor: Avishay Gal-Yam , Barak Zackay , Eran Ofek
- Applicant: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
- Applicant Address: IL Rehovot
- Assignee: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
- Current Assignee: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
- Current Assignee Address: IL Rehovot
- Agency: Pearl Cohen Zedek Latzer Baratz LLP
- Agent Mark S. Cohen
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@53e5026
- International Application: PCT/IL2016/050880 WO 20160811
- International Announcement: WO2017/025970 WO 20170216
- Main IPC: G06K9/46
- IPC: G06K9/46 ; G06T7/254 ; G06K9/00 ; G06K9/20 ; G06K9/40

Abstract:
A System and a method for processing at least two M-dimensional data-measurements (DMs) of a physical-property for detecting one or more new-objects and/or a transition of one or more known-objects, in complex constant-background DMs, using at least one processor and at least one memory element, the method comprising: generating a filtered-new-DM by match-filtering a new-DM, respective to impulse response of a reference-DM; generating a filtered-reference-DM by match-filtering the reference-DM, respective to impulse response of the new-DM; generating an M-dimensional object-indicator (OI) by subtracting the filtered-reference-DM from the filtered-new-DM, or vice versa; and generating an M-dimensional data score (DS) from the M-dimensional OI, where each of the scores is a probe for existence of an object at a specific M-dimensional location.
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