Invention Grant
- Patent Title: Method for measuring electromagnetic signal radiated from device and electronic device thereof
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Application No.: US16683692Application Date: 2019-11-14
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Publication No.: US10779427B2Publication Date: 2020-09-15
- Inventor: Youngbae Lee , Seungwoo Lee , Seungnyun Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@33410f92
- Main IPC: H05K5/02
- IPC: H05K5/02 ; G01N27/90 ; H04M1/02 ; G06F1/16

Abstract:
A method for measuring an electromagnetic (EM) signal radiated from an external electronic device and an electronic device thereof are provided. The electronic device includes a housing, a display, a first conducting unit, a second conducting unit, at least one EM sensing circuit, at least one wireless communication circuit, a processor, and a memory. The memory stores instructions of when being executed, enabling the processor to receive, by using the first conducting unit, a first signal sensed by the EM sensing circuit, and receive, by using the second conducting unit, a second signal sensed by the EM sensing circuit, and provide a signal pattern on the basis of the first signal and the second signal, and identify an external electronic device, at least partially on the basis of the signal pattern.
Public/Granted literature
- US20200154583A1 METHOD FOR MEASURING ELECTROMAGNETIC SIGNAL RADIATED FROM DEVICE AND ELECTRONIC DEVICE THEREOF Public/Granted day:2020-05-14
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