Invention Grant
- Patent Title: Test substrate and manufacturing method thereof, detection method, display substrate and display device
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Application No.: US16405726Application Date: 2019-05-07
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Publication No.: US10784445B2Publication Date: 2020-09-22
- Inventor: Ling Wang , Cuili Gai , Pan Xu , Yicheng Lin
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: McDermott Will & Emery LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@18c5cb56
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L51/00 ; H01L27/32 ; H01L51/52 ; H01L51/56

Abstract:
A test substrate includes a base and a first electrode layer, a pixel defining layer, a light-emitting functional layer and a second electrode layer disposed on the base in sequence. The test substrate has at least two test regions, and each test region is a region where one first electrode of the plurality of first electrodes is located. Each test region includes a first region. Orthographic projections of portions of the pixel defining layer and the light-emitting functional layer located in a same first region on the base overlap with each other, and areas of orthographic projections of portions of the first electrode layer located in first regions of the at least two test regions are different.
Information query
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