- 专利标题: Apparatus and method for measuring a signal
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申请号: US16451183申请日: 2019-06-25
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公开(公告)号: US10784651B2公开(公告)日: 2020-09-22
- 发明人: Davide Marangon , Zhiliang Yuan , Marco Lucamarini , Andrew James Shields
- 申请人: Kabushiki Kaisha Toshiba
- 申请人地址: JP Minato-ku
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Minato-ku
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@b6b0fe6
- 主分类号: H01S5/062
- IPC分类号: H01S5/062 ; H01S3/10 ; H01S5/00
摘要:
An apparatus for measuring an input signal, the apparatus comprising: a first light source configured to output a sequence of pulses of light, wherein there is a random relationship between the phase of the pulses; a beam splitter having first and second inputs and first and second outputs, said first input being arranged to receive light pulses from said first light source and the second input being arranged to receive said input signal; a differencing circuit adapted to subtract signals obtained from the first and second outputs from each other; and output a value; and a processing circuit adapted to estimate the minimum entropy of said input signal, from the output of the differencing circuit corresponding to a sequence of said light pulses from the first light source.
公开/授权文献
- US20190393675A1 APPARATUS AND METHOD FOR MEASURING A SIGNAL 公开/授权日:2019-12-26
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