Invention Grant
- Patent Title: Method and apparatus for measuring displacement of object using multiple frequency signal
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Application No.: US16220714Application Date: 2018-12-14
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Publication No.: US10785083B2Publication Date: 2020-09-22
- Inventor: Dong Kyoo Kim
- Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Agency: LRK Patent Law Firm
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7735265d
- Main IPC: H04L27/34
- IPC: H04L27/34 ; H04L27/38 ; H04L27/227 ; G01S13/538 ; G01S13/536 ; H04J1/06 ; H04L27/36

Abstract:
A method and an apparatus for measuring a displacement of an object according to steps of: dividing a signal into an I signal and a Q signal according to a phase of the signal, wherein the signal is reflected by the object after a transmission signal having a plurality of frequencies is emitted toward the object by the radar measurement system; estimating a direct current (DC) component from an N-tuple information acquired from the I signal and the Q signal; removing the estimated DC component to correct the I signal and the Q signal; and measuring the displacement of the object based on the corrected I signal and Q signal are provided.
Public/Granted literature
- US20190190767A1 METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF OBJECT USING MULTIPLE FREQUENCY SIGNAL Public/Granted day:2019-06-20
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