Invention Grant
- Patent Title: Log-based computer failure diagnosis
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Application No.: US16207851Application Date: 2018-12-03
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Publication No.: US10795753B2Publication Date: 2020-10-06
- Inventor: Jianwu Xu , Hui Zhang , Haifeng Chen , Tanay Kumar Saha , Pranay Anchuri
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: JP
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP
- Agent Joseph Kolodka
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06K9/62 ; G06F11/14 ; G06K9/68

Abstract:
Methods and systems for system failure diagnosis and correction include extracting syntactic patterns from a plurality of logs with heterogeneous formats. The syntactic patterns are clustered according to categories of system failure. A single semantically unique pattern is extracted for each category of system failure. The semantically unique patterns are matched to recent log information to detect a corresponding system failure. A corrective action us performed responsive to the detected system failure.
Public/Granted literature
- US20190179691A1 LOG-BASED COMPUTER FAILURE DIAGNOSIS Public/Granted day:2019-06-13
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