Invention Grant
- Patent Title: Static random access memory cell and operating method thereof capable of reducing leakage current
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Application No.: US16290950Application Date: 2019-03-03
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Publication No.: US10796752B2Publication Date: 2020-10-06
- Inventor: Yung-Ting Chen , Hsueh-Chun Hsiao
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@769a61c0
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/419 ; G11C11/412

Abstract:
A static random access memory cell includes first and second cross-coupled inverters, a write transistor and a read transistor. The first inverter has a first latch node and the second inverter has a second latch node. The write transistor is coupled in series with a wordline transistor between the first latch node of the first inverter and a bitline. The read transistor is coupled between the bitline and a reference terminal and has a control terminal coupled to the first latch node of the first inverter. A method of operating the static random access memory cell includes enabling the wordline transistor during a write operation, and enabling the write transistor during the write operation. The reference terminal is set to floating during the write operation.
Public/Granted literature
- US20200258570A1 STATIC RANDOM ACCESS MEMORY CELL AND OPERATING METHOD THEREOF CAPABLE OF REDUCING LEAKAGE CURRENT Public/Granted day:2020-08-13
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