Invention Grant
- Patent Title: Memory device and semiconductor device
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Application No.: US15292362Application Date: 2016-10-13
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Publication No.: US10797054B2Publication Date: 2020-10-06
- Inventor: Yutaka Shionoiri , Hiroyuki Miyake , Kiyoshi Kato
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office
- Agent Eric J. Robinson
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@15bde676
- Main IPC: H01L29/10
- IPC: H01L29/10 ; H01L29/12 ; H01L27/105 ; H01L27/1156 ; H01L27/12 ; H01L27/13 ; H01L27/115 ; H01L29/786 ; G11C16/04

Abstract:
It is an object to provide a memory device whose power consumption can be suppressed and a semiconductor device including the memory device. As a switching element for holding electric charge accumulated in a transistor which functions as a memory element, a transistor including an oxide semiconductor film as an active layer is provided for each memory cell in the memory device. The transistor which is used as a memory element has a first gate electrode, a second gate electrode, a semiconductor film located between the first gate electrode and the second gate electrode, a first insulating film located between the first gate electrode and the semiconductor film, a second insulating film located between the second gate electrode and the semiconductor film, and a source electrode and a drain electrode in contact with the semiconductor film.
Public/Granted literature
- US20170033110A1 MEMORY DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2017-02-02
Information query
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