Invention Grant
- Patent Title: System and method for assessing image quality
-
Application No.: US16155680Application Date: 2018-10-09
-
Publication No.: US10803585B2Publication Date: 2020-10-13
- Inventor: Andre de Almeida Maximo , Chitresh Bhushan , Thomas Kwok-Fah Foo , Desmond Teck Beng Yeo
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06K9/62 ; G06N3/08 ; G06T3/40

Abstract:
The present disclosure relates to the classification of images, such as medical images using machine learning techniques. In certain aspects, the technique may employ a distance metric for the purpose of classification, where the distance metric determined for a given image with respect to a homogenous group or class of images is used to classify the image.
Public/Granted literature
- US20200111210A1 SYSTEM AND METHOD FOR ASSESSING IMAGE QUALITY Public/Granted day:2020-04-09
Information query