Invention Grant
- Patent Title: Unevenness correction data generation method and unevenness correction data generation system
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Application No.: US16700052Application Date: 2019-12-02
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Publication No.: US10803782B2Publication Date: 2020-10-13
- Inventor: Hiroshi Murase
- Applicant: IIX INC. , PHOTOLAB INC.
- Applicant Address: JP Tokyo JP Urayasu-shi
- Assignee: IIX INC.,PHOTOLAB INC.
- Current Assignee: IIX INC.,PHOTOLAB INC.
- Current Assignee Address: JP Tokyo JP Urayasu-shi
- Agency: Oliff PLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@28b33587
- Main IPC: G09G3/20
- IPC: G09G3/20

Abstract:
An unevenness correction data generation method provided for generating unevenness correction data for effectively improving the yield of a display panel. The method includes: a step of capturing an image of a display panel where a predetermined pattern is displayed; a step of generating iteration data for correcting unevenness of the captured image; a step of storing the iteration data in a storage means; a step of capturing an image of the display panel where a pattern in the storage means is displayed; a step of generating iteration data for correcting unevenness of the captured image; a step of storing iteration data in the storage means; a step of judging whether or not an ending condition for ending repetition of the steps is satisfied; and a step of generating the unevenness correction data based on the iteration data stored in the storage means the ending condition is satisfied.
Public/Granted literature
- US20200175907A1 UNEVENNESS CORRECTION DATA GENERATION METHOD AND UNEVENNESS CORRECTION DATA GENERATION SYSTEM Public/Granted day:2020-06-04
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