• Patent Title: Unevenness correction data generation method and unevenness correction data generation system
  • Application No.: US16700052
    Application Date: 2019-12-02
  • Publication No.: US10803782B2
    Publication Date: 2020-10-13
  • Inventor: Hiroshi Murase
  • Applicant: IIX INC.PHOTOLAB INC.
  • Applicant Address: JP Tokyo JP Urayasu-shi
  • Assignee: IIX INC.,PHOTOLAB INC.
  • Current Assignee: IIX INC.,PHOTOLAB INC.
  • Current Assignee Address: JP Tokyo JP Urayasu-shi
  • Agency: Oliff PLC
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@28b33587
  • Main IPC: G09G3/20
  • IPC: G09G3/20
Unevenness correction data generation method and unevenness correction data generation system
Abstract:
An unevenness correction data generation method provided for generating unevenness correction data for effectively improving the yield of a display panel. The method includes: a step of capturing an image of a display panel where a predetermined pattern is displayed; a step of generating iteration data for correcting unevenness of the captured image; a step of storing the iteration data in a storage means; a step of capturing an image of the display panel where a pattern in the storage means is displayed; a step of generating iteration data for correcting unevenness of the captured image; a step of storing iteration data in the storage means; a step of judging whether or not an ending condition for ending repetition of the steps is satisfied; and a step of generating the unevenness correction data based on the iteration data stored in the storage means the ending condition is satisfied.
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