- 专利标题: Sample gauge length and length after fracture measuring device
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申请号: US16258798申请日: 2019-01-28
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公开(公告)号: US10823543B2公开(公告)日: 2020-11-03
- 发明人: Hanbao Sun , Jinqi Lv , Yingwei Zhu , Jingying Liu , Yingfeng Wang , Zhuxing Wang , Zhihua Zhu
- 申请人: CITIC Dicastal CO., LTD.
- 申请人地址: CN Qinhuangdao
- 专利权人: CITIC Dicastal CO., LTD.
- 当前专利权人: CITIC Dicastal CO., LTD.
- 当前专利权人地址: CN Qinhuangdao
- 代理机构: Cooper Legal Group, LLC
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@28ac3b2f
- 主分类号: G01B5/02
- IPC分类号: G01B5/02 ; G01B5/04 ; G01N3/04 ; G01N3/06
摘要:
A sample gauge length and length after fracture measuring device includes a worktable, a first sliding table support and a second sliding table support, a control and length display, a spiral micrometer head, a scriber, a sample, etc. The reading device using the spiral micrometer head to directly measure the gauge length and the length after fracture has a detection accuracy of ±0.01 mm, which is superior to the requirement of ±0.05 mm in GB/T228 Metallic Materials Tensile Testing at Ambient Temperature.
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