- Patent Title: Determination of cause of error state of elements in a computing environment based on an element's number of impacted elements and the number in an error state
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Application No.: US16048291Application Date: 2018-07-29
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Publication No.: US10831587B2Publication Date: 2020-11-10
- Inventor: Maneesh Keshavan Bendiganavale , Pavan Belur Gopalakrishna Upadhya , Naveena Kedlaya , Vinay Sahadevappa Banakar
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Hewlett Packard Enterprise Patent Department
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F16/901 ; G06F11/34
Abstract:
In an example, suspect scores for impacting elements that can cause an error state of a first element are computed. The computation is performed based on states of each element for which the impacting element can cause the error state.
Public/Granted literature
- US20200034222A1 DETERMINATION OF CAUSE OF ERROR STATE OF ELEMENTS Public/Granted day:2020-01-30
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