Invention Grant
- Patent Title: Intermittent failure metrics in technological processes
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Application No.: US16263363Application Date: 2019-01-31
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Publication No.: US10831648B2Publication Date: 2020-11-10
- Inventor: Jian Zhang , Minghao Lu , Xiaolu Ye , Ning He
- Applicant: Splunk Inc.
- Applicant Address: US CA San Francisco
- Assignee: Splunk Inc.
- Current Assignee: Splunk Inc.
- Current Assignee Address: US CA San Francisco
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36 ; G06F9/50 ; G06F17/11 ; G06F9/48 ; G06F9/54

Abstract:
Systems and methods for testing a subject system with a software testing process are described. The system receives Boolean states responsive to repeatedly applying a first test case to a subject system. Each Boolean state signifies an outcome of an application of the first test case to a version of a first software feature over a span of time. The system identifies test case outcomes for the first test case that are adjacent in time and different and generates an intermittency value for the first test case. The system determines that the intermittency value for the first test case exceeds an intermittency threshold and alerts an engineering resource. Finally, the system repeats the above operations until the intermittency value for the first test case does not exceed the intermittency threshold.
Public/Granted literature
- US20190243753A1 INTERMITTENT FAILURE METRICS IN TECHNOLOGICAL PROCESSES Public/Granted day:2019-08-08
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