Invention Grant
- Patent Title: Method of assisting analysis of radiation image and system using the same
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Application No.: US15804195Application Date: 2017-11-06
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Publication No.: US10832397B2Publication Date: 2020-11-10
- Inventor: Zhiqiang Chen , Yuanjing Li , Xianghao Wu , Jundi Dai , Yange Du , Limin Liu
- Applicant: Nuctech Company Limited
- Applicant Address: CN Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: Scully Scott Murphy & Presser
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@78912cd4
- Main IPC: G06K9/46
- IPC: G06K9/46 ; G06T7/00 ; G01V5/00 ; G06K9/62

Abstract:
The present application relates to a method of assisting analysis of a radiation image and a system using the same, which belongs to the field of image processing. A method of assisting analysis of a radiation image includes: acquiring a radiation image to be analyzed; acquiring customs declaration information of the radiation image to be analyzed; acquiring a feature-matched historical image from a typical image library according to the radiation image to be analyzed; and/or acquiring a standard image and/or detailed customs declaration information of the standard image according to the customs declaration information of the radiation image to be analyzed. The method of assisting analysis of a radiation image and the system using the same may assist an image inspection person to judge whether or not the current radiation image carries violation items, whether or not a concealing or missing report occurs and so on.
Public/Granted literature
- US20180150951A1 METHOD OF ASSISTING ANALYSIS OF RADIATION IMAGE AND SYSTEM USING THE SAME Public/Granted day:2018-05-31
Information query