- 专利标题： Method and testing device for testing wiring of transformers
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申请号： US15579486申请日： 2016-07-07
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公开(公告)号： US10859612B2公开(公告)日： 2020-12-08
- 发明人: Ulrich Klapper , Steffen Kaiser
- 申请人： Omicron electronics GmbH
- 申请人地址： AT Klaus
- 专利权人： Omicron electronics GmbH
- 当前专利权人： Omicron electronics GmbH
- 当前专利权人地址： AT Klaus
- 代理机构： Cook Alex Ltd.
- 优先权： AT50586/2015 20150707
- 国际申请： PCT/EP2016/066100 WO 20160707
- 国际公布： WO2017/005846 WO 20170112
- 主分类号： G01R31/06
- IPC分类号： G01R31/06 ; G01R29/20 ; G01R21/06 ; G01R19/25 ; H02H3/04 ; G01R31/327 ; G01R35/02 ; G01R31/67 ; G01R19/14
摘要：
A testing device for an apparatus of an energy system which has inputs that can be connected in a conductive manner to at least one current transformer and at least one voltage transformer. The testing device is designed to apply a first test signal to a secondary side of the voltage transformer and, at the same time, to apply a second test signal to a primary side of the current transformer.
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