Invention Grant
- Patent Title: Method of measuring interference
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Application No.: US16388467Application Date: 2019-04-18
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Publication No.: US10887205B2Publication Date: 2021-01-05
- Inventor: Jae Hoon Chung , Hyun Soo Ko , Moon Il Lee , Bin Chul Ihm
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Lee Hong Degerman Kang Waimey
- Priority: KR10-2008-0071821 20080723
- Main IPC: H04L12/26
- IPC: H04L12/26 ; H04B17/345 ; H04B17/373 ; H04L5/00

Abstract:
A method of measuring interference to perform efficient data communication is disclosed. A method of measuring interference of neighboring cells comprises allocating one or more first resource elements, to which pilot signals are allocated, to predetermined symbol regions included in a first resource block; allocating one or more second resource elements for measuring interference of the neighboring cells to a first symbol region of the predetermined symbol regions; and measuring interference of the neighboring cells using the one or more second resource elements.
Public/Granted literature
- US20190245764A1 METHOD OF MEASURING INTERFERENCE Public/Granted day:2019-08-08
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