Invention Grant
- Patent Title: Automated RFID tag profiling at application
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Application No.: US16738732Application Date: 2020-01-09
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Publication No.: US10892836B2Publication Date: 2021-01-12
- Inventor: Sergey Parshin , Jon R. Ducrou , Ryan David Hapgood , Jeanette Rogers , Uladzimir Silchanka , Shanmugarajan Muthu Pandian , Matthew Lake , Bradley Nathaniel Gray , Yeyang Yu
- Applicant: Amazon Technologies, Inc.
- Applicant Address: US WA Seattle
- Assignee: Amazon Technologies, Inc.
- Current Assignee: Amazon Technologies, Inc.
- Current Assignee Address: US WA Seattle
- Agency: Patterson + Sheridan, LLP
- Main IPC: H04B17/391
- IPC: H04B17/391 ; G06K7/00 ; G06K7/10

Abstract:
A system that performs self-diagnosing of unreliable radio frequency identification (RFID) tags in a first location within an environment includes an RFID printer that prints RFID tags in the first location and RFID antennas located at different distances to the first location. The system obtains, for each RFID tag, a first set of RFID parameters of the RFID tag for each RFID antenna when the RFID tag is in the first location. The system generates, for each RFID tag, a model of RFID tag behavior over different distances to an RFID antenna, based at least in part on the first set of RFID parameters obtained for the RFID tag.
Public/Granted literature
- US20200313781A1 AUTOMATED RFID TAG PROFILING AT APPLICATION Public/Granted day:2020-10-01
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