Invention Grant
- Patent Title: Methods and apparatus to determine non linearity in analog-to-digital converters
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Application No.: US15620770Application Date: 2017-06-12
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Publication No.: US10897262B2Publication Date: 2021-01-19
- Inventor: Akhilesh Kesavanunnithan , Sharat Chandra Rudrasamudram , Henry Manoj D'Souza , Vivek Varier
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Charles A. Brill; Frank D. Cimino
- Priority: IN201741009531 20170320
- Main IPC: H03M1/06
- IPC: H03M1/06 ; H03M1/10 ; H03M1/12

Abstract:
Methods and apparatus for determining non-linearity in analog-to-digital converters are disclosed. An example apparatus includes a signal interface to receive an output of an analog-to-digital converter (ADC), the output corresponding to a periodic signal transmitted to the ADC; a signal transformer to determine at least one of a harmonic phase or a harmonic amplitude corresponding to the output; and an integral non-linearity (INL) term calculator to determine the INL of the ADC based on a characteristic of the periodic signal and the at least one of the harmonic phase or the harmonic amplitude.
Public/Granted literature
- US20180269889A1 METHODS AND APPARATUS TO DETERMINE NON-LINEARITY IN ANALOG-TO-DIGITAL CONVERTERS Public/Granted day:2018-09-20
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