Invention Grant
- Patent Title: Measuring apparatus management system and program
-
Application No.: US16027854Application Date: 2018-07-05
-
Publication No.: US10900764B2Publication Date: 2021-01-26
- Inventor: Toshiyuki Tamai , Kozaburo Suzuki
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2017-137210 20170713
- Main IPC: G01B5/016
- IPC: G01B5/016 ; G01B5/20 ; G01B21/04
Abstract:
A measuring apparatus management system of the present invention includes an acquirer acquiring condition information indicating a status of a replacement component in each of a plurality of measuring apparatuses, and a predictor predicting a replacement time of the replacement component based on the condition information obtained by the acquirer.
Public/Granted literature
- US20190017797A1 MEASURING APPARATUS MANAGEMENT SYSTEM AND PROGRAM Public/Granted day:2019-01-17
Information query
