- 专利标题: Form measuring apparatus
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申请号: US16207706申请日: 2018-12-03
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公开(公告)号: US10900765B2公开(公告)日: 2021-01-26
- 发明人: Atsushi Shimaoka , Kazuhiko Hidaka
- 申请人: MITUTOYO CORPORATION
- 申请人地址: JP Kanagawa
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kanagawa
- 代理机构: Greenblum & Bernstein, P.L.C.
- 优先权: JP2017-232532 20171204
- 主分类号: G01B5/28
- IPC分类号: G01B5/28 ; G01B5/20 ; G01B7/34 ; G01B5/00 ; G01B5/30
摘要:
A form measuring apparatus includes a base; an arm capable of swinging relative to the base; a coupler coupling the base and the arm, and having a deformation region that is capable of elastic deformation between the base and the arm; and a distortion detector installed in the deformation region. In the form measuring apparatus, a stylus is mounted to the arm and can slide along a surface of a work piece.
公开/授权文献
- US20190170493A1 FORM MEASURING APPARATUS 公开/授权日:2019-06-06
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