Invention Grant
- Patent Title: Form measuring apparatus
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Application No.: US16207706Application Date: 2018-12-03
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Publication No.: US10900765B2Publication Date: 2021-01-26
- Inventor: Atsushi Shimaoka , Kazuhiko Hidaka
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2017-232532 20171204
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B5/20 ; G01B7/34 ; G01B5/00 ; G01B5/30

Abstract:
A form measuring apparatus includes a base; an arm capable of swinging relative to the base; a coupler coupling the base and the arm, and having a deformation region that is capable of elastic deformation between the base and the arm; and a distortion detector installed in the deformation region. In the form measuring apparatus, a stylus is mounted to the arm and can slide along a surface of a work piece.
Public/Granted literature
- US20190170493A1 FORM MEASURING APPARATUS Public/Granted day:2019-06-06
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