- 专利标题: Holder and charged particle beam apparatus
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申请号: US16992430申请日: 2020-08-13
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公开(公告)号: US10937626B2公开(公告)日: 2021-03-02
- 发明人: Kotaro Hosoya
- 申请人: HITACHI HIGH-TECH CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECH CORPORATION
- 当前专利权人: HITACHI HIGH-TECH CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 主分类号: H01J37/20
- IPC分类号: H01J37/20 ; H01J37/244 ; H01J37/22 ; H01J37/26
摘要:
According to one embodiment, a holder includes a top member, a side member, and a bottom member. The top member has a hole for allowing transmission of a charged particle beam, and the sample is mountable in the hole. The bottom member is provided to overlap with the top member in a plan view. The side member is connected to a part of the top member and a part of the bottom member such that the top member and the bottom member are separated from each other in a cross-sectional view. An opening portion is a region surrounded by the top member, the side member, and the bottom member, and a scintillator is provided in the opening portion.
公开/授权文献
- US20200373119A1 HOLDER AND CHARGED PARTICLE BEAM APPARATUS 公开/授权日:2020-11-26
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