Invention Grant
- Patent Title: Alignment measurement system
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Application No.: US16639566Application Date: 2018-07-02
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Publication No.: US10942461B2Publication Date: 2021-03-09
- Inventor: Simon Reinald Huisman , Sebastianus Adrianus Goorden , Irwan Dani Setija
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP17186443 20170816,EP18158094 20180222
- International Application: PCT/EP2018/067729 WO 20180702
- International Announcement: WO2019/034318 WO 20190221
- Main IPC: G03F9/00
- IPC: G03F9/00

Abstract:
An apparatus for determining a characteristic of a feature of an object comprises: a measurement radiation source; a measurement radiation delivery system; a measurement system; a pump radiation source; and a pump radiation delivery system. The measurement radiation source is operable to produce measurement radiation and the measurement radiation delivery system is operable to irradiate at least a part of a top surface of the object with the measurement radiation. The measurement system is operable to receive at least a portion of the measurement radiation scattered from the top surface and is further operable to determine a characteristic of the feature of the object from at least a portion of the measurement radiation scattered from the top surface. The pump radiation source is operable to produce pump radiation and the pump radiation delivery system is operable to irradiate at least a part of the top surface of the object with the pump radiation so as to produce a mechanical response (for example an acoustic wave) in the object.
Public/Granted literature
- US20200241433A1 Alignment Measurement System Public/Granted day:2020-07-30
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