- 专利标题： Transformer test device and method for testing a transformer
-
申请号： US15522323申请日： 2015-10-28
-
公开(公告)号： US10955490B2公开(公告)日： 2021-03-23
- 发明人: Reinhard Kaufmann , Boris Unterer , Markus Pütter
- 申请人： OMICRON ELECTRONICS GMBH
- 申请人地址： AT Klaus
- 专利权人： OMICRON ELECTRONICS GMBH
- 当前专利权人： OMICRON ELECTRONICS GMBH
- 当前专利权人地址： AT Klaus
- 代理机构： Seyfarth Shaw LLP
- 代理商 Brian Michaelis
- 优先权： ATA50783/2014 20141030
- 国际申请： PCT/EP2015/075018 WO 20151028
- 国际公布： WO2016/066701 WO 20160506
- 主分类号： G01R31/62
- IPC分类号： G01R31/62 ; G01R31/72 ; H01H9/54 ; H01H9/00
摘要：
A transformer test device (10) for testing a transformer (40) has connections (12) for releasably connecting the transformer test device (10) to the transformer (40). The transformer test device (10) has a source (13) for generating a test signal for testing the transformer (40). The transformer test device (10) has a controllable switching means (15) which is connected to the connections (12) during a transformer test for the purpose of short-circuiting at least one winding (42) of the transformer (40).
公开/授权文献
信息查询
