Invention Grant
- Patent Title: Methods and systems for testing storage devices via a representative I/O generator
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Application No.: US15853419Application Date: 2017-12-22
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Publication No.: US10956294B2Publication Date: 2021-03-23
- Inventor: Janki Sharadkumar Bhimani , Rajinikanth Pandurangan , Vijay Balakrishnan , Changho Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G06F11/34
- IPC: G06F11/34 ; G06F3/06 ; G06F11/30

Abstract:
A system and method of generating representative I/O. The system is configured to utilize representative I/O patterns stored in a pattern database. A user may select one or more patterns to perform I/O using. The patterns are modified according to user supplied parameters and multiple parameters are integrated into a single workload. I/O is then generated according to the workload and system performance may be measured.
Public/Granted literature
- US20190087300A1 METHODS AND SYSTEMS FOR TESTING STORAGE DEVICES VIA A REPRESENTATIVE I/O GENERATOR Public/Granted day:2019-03-21
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