Methods and systems for testing storage devices via a representative I/O generator
Abstract:
A system and method of generating representative I/O. The system is configured to utilize representative I/O patterns stored in a pattern database. A user may select one or more patterns to perform I/O using. The patterns are modified according to user supplied parameters and multiple parameters are integrated into a single workload. I/O is then generated according to the workload and system performance may be measured.
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