Invention Grant
- Patent Title: Mura correction system
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Application No.: US16723103Application Date: 2019-12-20
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Publication No.: US10964241B2Publication Date: 2021-03-30
- Inventor: Ki Taek Kim , Jun Young Park , Doo Hwa Jang , Seung Wan Yu , Do Yeon Kim
- Applicant: Silicon Works Co., Ltd.
- Applicant Address: KR Daejeon
- Assignee: Silicon Works Co., Ltd.
- Current Assignee: Silicon Works Co., Ltd.
- Current Assignee Address: KR Daejeon
- Agency: Polsinelli PC
- Priority: KR10-2018-0169626 20181226
- Main IPC: G09G3/00
- IPC: G09G3/00

Abstract:
A Mura correction system which detects and corrects Mura in a detection image obtained by photographing a display panel. The Mura correction system detects a Mura block by checking, based on a brightness value, detection images obtained by photographing test images displayed on a display panel, generates coefficient values of coefficients of a Mura correction equation, and generates Mura correction data including a position value of the Mura block and the coefficient values of the coefficients of the Mura correction equation.
Public/Granted literature
- US20200211429A1 MURA CORRECTION SYSTEM Public/Granted day:2020-07-02
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