Invention Grant
- Patent Title: Methods of forming semiconductor devices comprising silicon nitride on high aspect ratio features
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Application No.: US15857920Application Date: 2017-12-29
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Publication No.: US10964532B2Publication Date: 2021-03-30
- Inventor: Sumeet C. Pandey , Brenda D. Kraus , Stefan Uhlenbrock , John A. Smythe , Timothy A. Quick
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
Methods of forming silicon nitride. Silicon nitride is formed on a substrate by atomic layer deposition at a temperature of less than or equal to about 275° C. The as-formed silicon nitride is exposed to a plasma. The silicon nitride may be formed as a portion of silicon nitride and at least one other portion of silicon nitride. The portion of silicon nitride and the at least one other portion of silicon nitride may be exposed to a plasma treatment. Methods of forming a semiconductor structure are also disclosed, as are semiconductor structures and silicon precursors.
Public/Granted literature
- US20180144927A1 SEMICONDUCTOR STRUCTURES COMPRISING SILICON NITRIDE AND RELATED METHODS Public/Granted day:2018-05-24
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