An integrated circuit including a functional circuit including at least one swapping circuit node, multiple duplicate electronic circuits, and a switch circuit. The duplicate electronic circuits are integrated in close proximity with each other each including at least one electronic device that is susceptible to RTN. The switch circuit electrically couples a different selected subset of at least one of the duplicate electronic circuits to the at least one swapping circuit node for each of successive switching states during operation of the functional circuit. A method of reducing noise including selecting a subset of the duplicate electronic circuits, electrically coupling the selected duplicate electronic devices to at least one swapping circuit node of a functional circuit, and repeating the selecting and electrically coupling in successive switching states during operation of the functional circuit for different subsets of the duplicate electronic circuits.