Invention Grant
- Patent Title: Load state detection circuit and method
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Application No.: US16519127Application Date: 2019-07-23
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Publication No.: US10983154B2Publication Date: 2021-04-20
- Inventor: Yuqun Zeng , Kai Wu , Jirong Huo , Le Chu , Yanhui Fu , Qiandeng Li
- Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Applicant Address: CN Ningde
- Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Current Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Current Assignee Address: CN Ningde
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Priority: CN201811079845.9 20180917
- Main IPC: G01R31/00
- IPC: G01R31/00 ; H02H1/00 ; H02H3/16

Abstract:
Disclosed are a load state detection circuit and method. A microcontroller is connected to a switch unit which is connected between a detecting power supply and a load to be tested. A voltage sampling point is formed at either terminal of the load to be tested, and the voltage sampling circuit is connected between the voltage sampling point and the microcontroller. The voltage sampling circuit is configured to sample a voltage at the voltage sampling point. The microcontroller is configured to connect the load to be tested and the detecting power supply by controlling the switch unit, and determine whether a fault exists in the load to be tested according to a received voltage at the voltage sampling point sampled by the voltage sampling circuit, before connecting the load to be tested with the drive power supply.
Public/Granted literature
- US20200088778A1 LOAD STATE DETECTION CIRCUIT AND METHOD Public/Granted day:2020-03-19
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