- 专利标题: Semiconductor substrate manufacturing method, semiconductor device, and method for manufacturing same
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申请号: US16606789申请日: 2018-04-19
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公开(公告)号: US10988647B2公开(公告)日: 2021-04-27
- 发明人: Jun Kamada , Kaichiro Haruta , Takashi Unezaki , Kiyomi Imagawa , Kenichi Fujii , Yasuhisa Kayaba , Kazuo Kohmura
- 申请人: Mitsui Chemicals, Inc.
- 申请人地址: JP Tokyo
- 专利权人: Mitsui Chemicals, Inc.
- 当前专利权人: Mitsui Chemicals, Inc.
- 当前专利权人地址: JP Tokyo
- 代理机构: Buchanan Ingersoll & Rooney PC
- 优先权: JPJP2017-084694 20170421
- 国际申请: PCT/JP2018/016187 WO 20180419
- 国际公布: WO2018/194133 WO 20181025
- 主分类号: C09J179/08
- IPC分类号: C09J179/08 ; C09J5/00 ; H01L21/304 ; H01L21/56
摘要:
The purpose of the present invention is to provide a semiconductor substrate manufacturing method, which prevents detachment of a semiconductor wafer being ground, and which prevents cracking or chipping in a semiconductor substrate obtained. In order to solve the problem, the semiconductor substrate manufacturing method comprises: a polyimide layer forming step of forming a polyimide layer on a support material; a wafer attaching step of affixing the support material and a semiconductor wafer to each other with the polyimide layer disposed therebetween; a wafer grinding step of grinding the semiconductor wafer; a support material peeling step of peeling the support material from the polyimide layer; and a polyimide layer peeling step of peeling the polyimide layer from the semiconductor wafer. The polyimide layer includes polyimide which includes a benzophenone skeleton and an aliphatic structure, wherein an amine equivalent weight is 4000 to 20000.
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