Invention Grant
- Patent Title: Sensor alignment using homogeneous test mode
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Application No.: US16243850Application Date: 2019-01-09
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Publication No.: US10996085B2Publication Date: 2021-05-04
- Inventor: Johannes Janschitz , Helmut Koeck
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Harrity & Harrity, LLP
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01D5/16 ; G01D5/14

Abstract:
An alignment device may obtain a set of analog-to-digital converter (ADC) signals provided by an angle sensor operating in a homogeneous test mode. The set of ADC signals may be associated with a rotation of a target magnet relative to the angle sensor. The alignment device may identify a maximum ADC signal value based on the set of ADC signals. The alignment device may selectively position, by the alignment device, at least one of the angle sensor or the target magnet based on the maximum ADC signal value.
Public/Granted literature
- US20200217694A1 SENSOR ALIGNMENT USING HOMOGENEOUS TEST MODE Public/Granted day:2020-07-09
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