Invention Grant
- Patent Title: Laser marking system and method for laser marking a workpiece
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Application No.: US16510046Application Date: 2019-07-12
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Publication No.: US11000917B2Publication Date: 2021-05-11
- Inventor: Simon Raab , Mark S. Longmuir
- Applicant: Thorlabs Measurement Systems Inc.
- Applicant Address: US NJ Blairstown
- Assignee: Thorlabs Measurement Systems Inc.
- Current Assignee: Thorlabs Measurement Systems Inc.
- Current Assignee Address: US NJ Blairstown
- Agency: Myers Wolin, LLC
- Main IPC: B23K26/06
- IPC: B23K26/06 ; B23K26/18 ; B23K26/03 ; B23K26/082 ; B41M5/26 ; B41M5/00 ; B23K101/00

Abstract:
A laser marking system for marking a predetermined pattern on a workpiece may include a first light source structured to emit first light at a first wavelength; a second light source structured to emit second light at a second wavelength different from the first wavelength and selected to mark a marking surface of the workpiece; beam shaping optics structured to adjust a focal length of the second light; beam steering optics structured to aim the first laser light and the second laser light; a controller configured to control the first light source to emit the first light at the marking surface of the workpiece and control the beam steering optics to aim the second light so as to mark the marking surface of the workpiece and create the first predetermined pattern; and a camera structured to detect first light reflected from the marking surface and record an image.
Public/Granted literature
- US20210008663A1 LASER MARKING SYSTEM AND METHOD FOR LASER MARKING A WORKPIECE Public/Granted day:2021-01-14
Information query
IPC分类: