Invention Grant
- Patent Title: Feature parameter obtaining method and apparatus
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Application No.: US16832916Application Date: 2020-03-27
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Publication No.: US11012323B2Publication Date: 2021-05-18
- Inventor: Weiwei Chong , Xiaobo Wu , Yang Xin
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Guangdong
- Agency: Womble Bond Dickinson (US) LLP
- Priority: CN201710914073.5 20170930
- Main IPC: H04L12/24
- IPC: H04L12/24

Abstract:
A feature parameter obtaining method and apparatus are disclosed. The method includes: obtaining feature set information from a data analytics network element, where a feature set corresponding to the feature set information includes a first part of feature and a second part of feature; obtaining a first feature parameter of the first part of feature when data corresponds to the first part of feature; sending a request message to at least one second network element, to request a second feature parameter of the second part of feature when the data corresponds to the second part of feature; receiving the second feature parameter from the at least one second network element; and sending, based on the first feature parameter and the second feature parameter, a third feature parameter of the feature set when the data corresponds to the feature set to the data analytics network element.
Public/Granted literature
- US20200228422A1 FEATURE PARAMETER OBTAINING METHOD AND APPARATUS Public/Granted day:2020-07-16
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