- Patent Title: Apparatus and method for determining beam index of antenna array
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Application No.: US16961981Application Date: 2019-01-08
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Publication No.: US11018440B2Publication Date: 2021-05-25
- Inventor: Seongbeom Hong
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Cha & Reiter, LLC.
- Priority: KR10-2018-0026174 20180306
- International Application: PCT/KR2019/000289 WO 20190108
- International Announcement: WO2019/172518 WO 20190912
- Main IPC: H04B7/08
- IPC: H04B7/08 ; H01Q21/06 ; H04B7/06 ; H04B17/318

Abstract:
An electronic device is disclosed. The electronic device includes a first antenna array including a plurality of first antenna elements, a second antenna array including a plurality of second antenna elements, and a processor. The processor measures first signal strengths for every a plurality of beam indexes by means of the first antenna array and the second antenna array, determines second signal strengths for every the plurality of beam indexes by means of the first antenna array, and determines a beam index, a signal strength of which is maximal, based on a difference between the first signal strength and the second signal strength corresponding to a beam index selected among the plurality of beam indexes.
Public/Granted literature
- US20210083400A1 APPARATUS AND METHOD FOR DETERMINING BEAM INDEX OF ANTENNA ARRAY Public/Granted day:2021-03-18
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