发明授权
- 专利标题: Measuring device and measuring method for low-attenuation measuring environments
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申请号: US16045337申请日: 2018-07-25
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公开(公告)号: US11019513B2公开(公告)日: 2021-05-25
- 发明人: David Connolly
- 申请人: Rohde & Schwarz GmbH & Co. KG
- 申请人地址: DE Munich
- 专利权人: Rohde & Schwarz GmbH & Co. KG
- 当前专利权人: Rohde & Schwarz GmbH & Co. KG
- 当前专利权人地址: DE Munich
- 代理机构: Ditthavong, Steiner & Mlotkowski
- 主分类号: H04W24/08
- IPC分类号: H04W24/08 ; H04L12/24 ; H04W16/18
摘要:
A measuring device for performing measurements on a device under test is provided. It comprises a transmitter, which is adapted to transmit a first message to the device under test with a first transmission power. The first message comprises a first transmission power parameter and an expected reception power parameter. The measuring device moreover comprises a parameter generator, which is adapted to generate the first transmission power parameter larger than the first transmission power by an error value. The parameter generator is moreover adapted to generate the expected reception power parameter lower than an expected reception power of the measuring device, by the error value.
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