Invention Grant
- Patent Title: Survey system and method for identifying target
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Application No.: US16452603Application Date: 2019-06-26
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Publication No.: US11035670B2Publication Date: 2021-06-15
- Inventor: Nobuyuki Nishita
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chiesa Shahinian & Giantomasi PC
- Priority: JPJP2018-124860 20180629
- Main IPC: G01C11/18
- IPC: G01C11/18 ; G01S7/481 ; G01C15/00 ; G01S17/66

Abstract:
A survey system includes a survey device and a target. The survey device includes a main body rotatable around a vertical axis, a telescope supported by the main body and rotatable around a horizontal axis, a wide angle imaging unit having a second angle of view wider than a first angle of view of the telescope, and a target identification unit configured to identify a target image. The target image is identified based on a differential image between a first image captured by the wide angle imaging unit during an on-period with laser light emitted from an emission unit and a second image captured during an off-period in which laser light is not emitted from the emission unit. The target image is quickly identified even when the target is significantly separated in the horizontal direction from a position directly in front of the survey device.
Public/Granted literature
- US20200003558A1 SURVEY SYSTEM AND METHOD FOR IDENTIFYING TARGET Public/Granted day:2020-01-02
Information query
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