Invention Grant
- Patent Title: Method and apparatus for generating measurement plan for measuring X-ray CT
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Application No.: US16299513Application Date: 2019-03-12
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Publication No.: US11037337B2Publication Date: 2021-06-15
- Inventor: Kozo Ariga , Gyokubu Cho , Hidemitsu Asano , Masato Kon
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2018-051551 20180319
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G06T11/00 ; G01N23/046

Abstract:
When generating a measurement plan for measuring X-ray CT that performs X-ray irradiation while rotating a test object, and in doing so acquires projection image data, reconstructs volume data from the projection image data, and measures a targeted measurement location in the volume data, the present invention calculates required measurement accuracy and a measurement field of view range based on tolerance information included in CAD data of the test object and a measurement location on the test object defined by a measurement operator ahead of time, and automatically generates, from this information, an optimized measurement plan that minimizes the number of measurements.
Public/Granted literature
- US20190287274A1 METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING X-RAY CT Public/Granted day:2019-09-19
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