Invention Grant
- Patent Title: Roundness measuring device
-
Application No.: US16179227Application Date: 2018-11-02
-
Publication No.: US11041707B2Publication Date: 2021-06-22
- Inventor: Yoshiyuki Omori
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2017-217998 20171113
- Main IPC: G01B7/28
- IPC: G01B7/28 ; G01B3/34 ; G01B3/18

Abstract:
A roundness measuring device includes an annular ring, and a plurality of displacement sensors (comparative length measuring devices) provided on the ring at predetermined intervals. The displacement sensors are arranged such that lines along which measurement axes of the displacement sensors extend intersect at a single point.
Public/Granted literature
- US20190145753A1 ROUNDNESS MEASURING DEVICE Public/Granted day:2019-05-16
Information query