Invention Grant
- Patent Title: Measurement apparatus and method of measuring a target
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Application No.: US16410250Application Date: 2019-05-13
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Publication No.: US11042100B2Publication Date: 2021-06-22
- Inventor: Jin Lian , Zili Zhou , Duygu Akbulut , Sergey Tarabrin
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP18175297 20180531
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
The disclosure relates to measuring a target. In one arrangement, a measurement apparatus is provided that has an optical system configured to illuminate a target with radiation and direct reflected radiation from the target to a sensor. A programmable spatial light modulator in a pupil plane of the optical system is programmed to redirect light in each of a plurality of pupil plane zones in such a way as to form a corresponding plurality of images at different locations on the sensor. Each image is formed by radiation passing through a different respective one of the pupil plane zones.
Public/Granted literature
- US2650983A Antenna Public/Granted day:1953-09-01
Information query
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