- Patent Title: Device for acquiring pulse height spectrum, method for acquiring pulse height spectrum, program for acquiring pulse height spectrum, and radiation imaging apparatus
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Application No.: US16628253Application Date: 2018-05-23
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Publication No.: US11045153B2Publication Date: 2021-06-29
- Inventor: Isao Takahashi
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JPJP2017-141057 20170720
- International Application: PCT/JP2018/019814 WO 20180523
- International Announcement: WO2019/017069 WO 20190124
- Main IPC: A61B6/03
- IPC: A61B6/03 ; G01T1/36 ; A61B6/00 ; G01T1/15

Abstract:
A highly accurate pulse height spectrum is generated within a short amount of time, further cost of a radiation imaging apparatus being reduced by employing a detector that performs calibration using the pulse height spectrum. Provided is a pulse height spectrum acquisition device of a radiation detector including multiple counting units for counting a detected signal obtained by detecting incident X-rays, when a value of the detected signal is equal to or larger than a threshold, and for outputting a count value of each counting unit. This device is provided with a threshold setter configured to set to a first counting unit, a first threshold V1 as a threshold for a first measurement, along with setting to a second counting unit, a second threshold V2 larger than the first threshold V1, and to set to the first counting unit, a reconfigured threshold V1′ as the threshold for a second measurement, the reconfigured threshold V1′ being different from the first threshold V1, a measurement controller configured to perform multiple measurements, and a pulse height spectrum generator configured to generate a pulse height spectrum for the first threshold V1 of the first counting unit, on the basis of a difference in the count values from the first counting unit and the second counting unit, obtained by the multiple measurements performed by the measurement controller.
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