Invention Grant
- Patent Title: Integrated MIM diode
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Application No.: US16668004Application Date: 2019-10-30
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Publication No.: US11049980B2Publication Date: 2021-06-29
- Inventor: Scott Robert Summerfelt , Benjamin Stassen Cook
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Michael A. Davis, Jr.; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L29/88
- IPC: H01L29/88 ; H01L29/66 ; H01L23/522

Abstract:
In an integrated circuit, a metal-insulator-metal (MIM) diode includes: a first metallization structure level having a first metal layer; a first dielectric layer over the first metal layer; a metal contact or via on the first metal layer and extending through a portion of the first dielectric layer; and a second metallization structure level having a second metal layer; and a second dielectric layer over the second metal layer. The diode has a first electrode on the metal contact or via, a multilayer dielectric structure on the first electrode, and a second electrode between the multilayer dielectric structure and the second metal layer.
Public/Granted literature
- US20200168747A1 INTEGRATED MIM DIODE Public/Granted day:2020-05-28
Information query
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