Invention Grant
- Patent Title: Data collection
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Application No.: US16958849Application Date: 2018-01-08
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Publication No.: US11052691B2Publication Date: 2021-07-06
- Inventor: Antonio Gracia Verdugo , Aleix Fort Filgueira , Andreu Vinets Alonso
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Spring
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Spring
- Agency: HP Inc. Patent Department
- International Application: PCT/US2018/012845 WO 20180108
- International Announcement: WO2019/135777 WO 20190711
- Main IPC: B41J2/045
- IPC: B41J2/045 ; B41J29/393 ; B41J2/21

Abstract:
Examples of the present disclosure relate to a calibration method for a printing system. The method comprises printing a diagnostic pattern representative of decap time. The diagnostic pattern comprises the firing of nozzles after an exposure to ambient air during a first predetermined time period to produce a first pattern element and the firing of nozzles after an exposure to ambient air during a second predetermined time period to produce a second pattern element. The method includes scanning the resulting diagnostic pattern with a sensor to collect decap data in a digital form, digitally analyzing the decap data, the digital analysis comprising identifying a quantitative difference between the first and second pattern elements, and modifying a servicing process of the printing system if the quantitative difference passes a predetermined threshold.
Public/Granted literature
- US20210070078A1 DATA COLLECTION Public/Granted day:2021-03-11
Information query
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